{"id":15293,"date":"2024-09-17T10:04:27","date_gmt":"2024-09-17T08:04:27","guid":{"rendered":"https:\/\/dev.shimadzu-testing.com\/?p=15293"},"modified":"2025-02-05T10:46:55","modified_gmt":"2025-02-05T09:46:55","slug":"maivis-miv-x-ultrasonic-optical-flaw-detector-3","status":"publish","type":"post","link":"https:\/\/shimadzu-testing.com\/sk\/spolocnost\/news-events-press\/press\/maivis-miv-x-ultrasonic-optical-flaw-detector-3\/","title":{"rendered":"MAIVIS MIV-X - Ultrazvukov\u00fd optick\u00fd detektor ch\u00fdb"},"content":{"rendered":"<div data-elementor-type=\"wp-post\" data-elementor-id=\"15293\" class=\"elementor elementor-15293\" data-elementor-post-type=\"post\">\n\t\t\t\t<div class=\"elementor-element elementor-element-f279f52 e-flex e-con-boxed e-con e-parent\" data-id=\"f279f52\" data-element_type=\"container\">\n\t\t\t\t\t<div class=\"e-con-inner\">\n\t\t\t\t<div class=\"elementor-element elementor-element-06aaf77 elementor-widget elementor-widget-text-editor\" data-id=\"06aaf77\" data-element_type=\"widget\" data-widget_type=\"text-editor.default\">\n\t\t\t\t<div class=\"elementor-widget-container\">\n\t\t\t\t\t\t\t\t\t<p class=\"heading-normal\"><strong>Hlb\u0161ie\/lep\u0161ie vidie\u0165: nov\u00e1 technika kontroly vizu\u00e1lne odhal\u00ed chyby pod povrchom<\/strong><\/p><ul class=\"list-with-hyphen\"><li>Ultrazvukov\u00e1 optick\u00e1 detekcia ch\u00fdb je pokro\u010dil\u00e1, nov\u00e1 met\u00f3da anal\u00fdzy povrchu od spolo\u010dnosti Shimadzu.<\/li><li>MIV-X vyu\u017e\u00edva t\u00fato nede\u0161trukt\u00edvnu techniku na zis\u0165ovanie ch\u00fdb na povrchu - a dokonca aj pod n\u00edm.<\/li><li>MIV-X nielen\u017ee detekuje trhliny, dutiny, delamin\u00e1cie at\u010f.: vizu\u00e1lne ich zobrazuje.<\/li><li>MIV-X pon\u00faka aj intuit\u00edvne jednoduch\u00e9 pou\u017e\u00edvanie, jednoduchos\u0165 a r\u00fdchlos\u0165 na zv\u00fd\u0161enie v\u00fdkonu laborat\u00f3ria.<\/li><\/ul><div>\u00a0<\/div><p class=\"paragraph\">Spolo\u010dnos\u0165 Shimadzu, svetov\u00fd l\u00edder v oblasti analytick\u00fdch pr\u00edstrojov a testovac\u00edch zariaden\u00ed, oznamuje eur\u00f3pske vydanie svojho nov\u00e9ho ultrazvukov\u00e9ho optick\u00e9ho detektora ch\u00fdb: MIV-X. Na rozdiel od be\u017en\u00fdch ultrazvukov\u00fdch syst\u00e9mov na detekciu ch\u00fdb MIV-X odha\u013euje chyby na povrchu aj pod n\u00edm. MIV-X tie\u017e poskytuje jasn\u00fa vizualiz\u00e1ciu v\u0161etk\u00fdch zisten\u00fdch ch\u00fdb - \u010fal\u0161ie zlep\u0161enie oproti konven\u010dn\u00fdm syst\u00e9mom.<\/p>\t\t\t\t\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t\t\t<div class=\"elementor-element elementor-element-a1eb732 elementor-widget elementor-widget-text-editor\" data-id=\"a1eb732\" data-element_type=\"widget\" data-widget_type=\"text-editor.default\">\n\t\t\t\t<div class=\"elementor-widget-container\">\n\t\t\t\t\t\t\t\t\t<p class=\"paragraph\"><strong>V\u00fdrazn\u00e9 v\u00fdhody syst\u00e9mu MIV-X<\/strong><\/p><ul class=\"list-with-hyphen\"><li><strong>Zlep\u0161uje kontrolu povrchov\u00fdch aj pr\u00edzemn\u00fdch oblast\u00ed<\/strong><br \/>Be\u017en\u00e9 ultrazvukov\u00e9 detektory ch\u00fdb poskytuj\u00fa dobr\u00e9 v\u00fdsledky od 1-5 mm, zatia\u013e \u010do MIV-X \u013eahko pos\u00fava po\u010diato\u010dn\u00fd bod presn\u00e9ho vn\u00edmania na povrch. V\u010faka tomu je ide\u00e1lny na anal\u00fdzu odlupovania n\u00e1terov.<\/li><li><strong>Zv\u00e4\u010d\u0161uje oblas\u0165 kontroly d\u00e1vok<\/strong><br \/>Be\u017en\u00e9 techniky kontroluj\u00fa len obmedzen\u00fa oblas\u0165, zatia\u013e \u010do MIV-X vyu\u017e\u00edva cel\u00e9 zorn\u00e9 pole kamery na vymedzenie oblasti kontroly. T\u00fdm sa zv\u00e4\u010d\u0161uje pozorovacie pole a\u017e na 400 x 600 mm a skracuje sa celkov\u00fd \u010das kontroly.<\/li><li><strong>Odstra\u0148uje obavy z rozdielov v akustickej impedancii<\/strong><br \/>Kontrola materi\u00e1lov s r\u00f4znou akustickou impedanciou je pre be\u017en\u00e9 n\u00e1stroje n\u00e1ro\u010dn\u00e1. Pr\u00edstroj MIV-X \u00faspe\u0161ne prekon\u00e1va probl\u00e9m impedancie a presne zis\u0165uje defekty vo vzork\u00e1ch z viacer\u00fdch materi\u00e1lov<\/li><\/ul>\t\t\t\t\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t\t\t<div class=\"elementor-element elementor-element-20c9d37 elementor-widget elementor-widget-text-editor\" data-id=\"20c9d37\" data-element_type=\"widget\" data-widget_type=\"text-editor.default\">\n\t\t\t\t<div class=\"elementor-widget-container\">\n\t\t\t\t\t\t\t\t\t<p class=\"paragraph\"><strong>MIV = zvidite\u013eni\u0165<\/strong><\/p><p class=\"paragraph\">MAIVIS-MIV-X vyu\u017e\u00edva nov\u00fa, patentovan\u00fa techniku sveteln\u00e9ho zobrazovania spolo\u010dnosti Shimadzu na vizualiz\u00e1ciu skryt\u00fdch defektov. Kombin\u00e1ciou ultrazvukov\u00e9ho oscil\u00e1tora so stroboskopom je cie\u013eov\u00e1 oblas\u0165 vystaven\u00e1 kontinu\u00e1lnemu ultrazvukov\u00e9mu vlneniu a z\u00e1rove\u0148 laserov\u00e9mu sveteln\u00e9mu zobrazovaniu. Pozorovan\u00edm kontrolovanej oblasti kamerou sa pomocou shearografie (interferometrie so \u0161mykov\u00fdm obrazcom) \u013eahko a nede\u0161trukt\u00edvne zist\u00ed ak\u00fdko\u013evek mikroskopick\u00fd posun povrchu alebo povrchu v jeho bl\u00edzkosti. Na z\u00e1klade v\u00fdslednej diskontinuity ultrazvukovej vlny mo\u017eno na displeji vizualizova\u0165 ak\u00e9ko\u013evek nedostatky.<\/p><p class=\"paragraph\">T\u00e1to ultrazvukov\u00e1 optick\u00e1 detekcia ch\u00fdb umo\u017e\u0148uje vizualiz\u00e1ciu vn\u00fatorn\u00fdch ch\u00fdb, ktor\u00e9 je \u0165a\u017ek\u00e9 n\u00e1js\u0165 pomocou be\u017en\u00e9ho ultrazvukov\u00e9ho testovania - a\u017e do h\u013abky pribli\u017ene 1 mm - vr\u00e1tane odlupovania spojovac\u00edch a adh\u00e9znych povrchov heterog\u00e9nnych materi\u00e1lov, ako aj farieb, tepeln\u00fdch n\u00e1strekov a n\u00e1terov. A \u013eahko odhal\u00ed chyby v spojoch a lepen\u00fdch povrchoch vo v\u00fdskumn\u00fdch a v\u00fdvojov\u00fdch procesoch zah\u0155\u0148aj\u00facich viacmateri\u00e1lov\u00e9 materi\u00e1ly, ktor\u00e9 vznikaj\u00fa kombin\u00e1ciou r\u00f4znych materi\u00e1lov s cie\u013eom zv\u00fd\u0161i\u0165 pevnos\u0165 a zn\u00ed\u017ei\u0165 hmotnos\u0165.<\/p>\t\t\t\t\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t\t\t<div class=\"elementor-element elementor-element-22f771e elementor-widget elementor-widget-text-editor\" data-id=\"22f771e\" data-element_type=\"widget\" data-widget_type=\"text-editor.default\">\n\t\t\t\t<div class=\"elementor-widget-container\">\n\t\t\t\t\t\t\t\t\t<p class=\"paragraph\"><strong>V\u00fdkonn\u00e9 aplik\u00e1cie pre priemysel a v\u00fdskum a v\u00fdvoj<\/strong><\/p><p class=\"paragraph\">V\u010faka v\u00e4\u010d\u0161iemu rozsahu, h\u013abke a r\u00fdchlosti anal\u00fdzy pon\u00faka MIV-X mno\u017estvo v\u00fdhod pre priemyseln\u00e9 a v\u00fdskumn\u00e9 aplik\u00e1cie v oblastiach, ako s\u00fa materi\u00e1ly, chemik\u00e1lie, elektrotechnika, elektronika, polovodi\u010de, doprava a infra\u0161trukt\u00fara. Patria medzi ne:<\/p><ul class=\"list-with-hyphen\"><li><em>Kontrola spojov v r\u00f4znorod\u00fdch materi\u00e1loch<\/em><\/li><li><em>Kontrola trhl\u00edn v z\u00e1kladnom materi\u00e1li pod f\u00f3liou<\/em><\/li><li><em>Kontrola delamin\u00e1cie lepiaceho povrchu medzi CFRP a nehrdzavej\u00facou oce\u013eou<\/em><\/li><li><em>Kontrola delamin\u00e1cie adhez\u00edvneho povrchu medzi CFRP a tit\u00e1novou zliatinou<\/em><\/li><\/ul><p class=\"paragraph\">zis\u0165uje chyby v spojoch a spojovac\u00edch ploch\u00e1ch vo v\u00fdskumn\u00fdch a v\u00fdvojov\u00fdch procesoch zah\u0155\u0148aj\u00facich viacmateri\u00e1lov\u00e9 materi\u00e1ly, ktor\u00e9 vznikaj\u00fa kombin\u00e1ciou r\u00f4znych materi\u00e1lov s cie\u013eom zv\u00fd\u0161i\u0165 pevnos\u0165 a zn\u00ed\u017ei\u0165 hmotnos\u0165.<\/p>\t\t\t\t\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t\t\t<div class=\"elementor-element elementor-element-54f2cce elementor-widget elementor-widget-text-editor\" data-id=\"54f2cce\" data-element_type=\"widget\" data-widget_type=\"text-editor.default\">\n\t\t\t\t<div class=\"elementor-widget-container\">\n\t\t\t\t\t\t\t\t\t<p class=\"paragraph\"><strong>\u010eal\u0161ie hodnotn\u00e9 funkcie<\/strong><\/p><ul class=\"list-with-hyphen\"><li>Str\u00e1nka <strong>Odstr\u00e1nenie hluku<\/strong> Funkcia zjednodu\u0161uje identifik\u00e1ciu ch\u00fdb a poskytuje jasn\u00fd obraz ch\u00fdb vo vysokom rozl\u00ed\u0161en\u00ed.<\/li><li>Str\u00e1nka <strong>Zobrazenie a ozna\u010denie rozmerov<\/strong> funkcie zjednodu\u0161uj\u00fa identifik\u00e1ciu polohy a ve\u013ekosti defektu a jednoduch\u00e9 pou\u017e\u00edvate\u013esk\u00e9 rozhranie a \u0161ikovn\u00e9 pom\u00f4cky, ako je stupnica displeja (prav\u00edtko), umo\u017e\u0148uj\u00fa jednoduch\u00fa a jednozna\u010dn\u00fa prezent\u00e1ciu v\u00fdsledkov<\/li><li>Volite\u013en\u00fd <strong>S\u00faprava optick\u00e9ho zoomu<\/strong> poskytuje vizualiz\u00e1ciu e\u0161te men\u0161\u00edch defektov zn\u00ed\u017een\u00edm minim\u00e1lnej ve\u013ekosti detekcie pribli\u017ene dvojn\u00e1sobne (\u0161tandard MIV-X: z priemeru pribli\u017ene 1 mm na 0,5 mm). Umo\u017e\u0148uje tie\u017e nastavenie laserovej a optickej osi, \u010d\u00edm sa zlep\u0161uje rovnomernos\u0165 o\u017earovania.<\/li><\/ul>\t\t\t\t\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t\t\t<div class=\"elementor-element elementor-element-8411335 elementor-widget elementor-widget-text-editor\" data-id=\"8411335\" data-element_type=\"widget\" data-widget_type=\"text-editor.default\">\n\t\t\t\t<div class=\"elementor-widget-container\">\n\t\t\t\t\t\t\t\t\t<p class=\"paragraph\"><strong>Pokrok nad r\u00e1mec be\u017en\u00fdch rie\u0161en\u00ed<\/strong><\/p><p class=\"paragraph\">Ultrazvukov\u00fd optick\u00fd detektor ch\u00fdb MIV-X od spolo\u010dnosti Shimadzu zis\u0165uje a vizualizuje trhliny, dutiny, delamin\u00e1cie a in\u00e9 skryt\u00e9 chyby v oblastiach, kde je ultrazvukov\u00e9 testovanie n\u00e1ro\u010dn\u00e9 a ktor\u00e9 zvy\u010dajne nie je mo\u017en\u00e9 skontrolova\u0165 vizu\u00e1lne. S pr\u00edstrojom MIV-X m\u00f4\u017ee ka\u017ed\u00fd r\u00fdchlo a jednoducho vykona\u0165 vizu\u00e1lnu kontrolu povrchu a bl\u00edzkosti povrchu. V\u010faka t\u00fdmto a \u010fal\u0161\u00edm v\u00fdhodn\u00fdm vlastnostiam je MIV-X nov\u00fdm referen\u010dn\u00fdm zariaden\u00edm na r\u00fdchle, presn\u00e9 a jednoduch\u00e9 zis\u0165ovanie ch\u00fdb na povrchu a pod n\u00edm. Je to \u010fal\u0161ia u\u017eito\u010dn\u00e1 inov\u00e1cia od spolo\u010dnosti Shimadzu.<\/p><p>\u00a0<\/p>\t\t\t\t\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t\t\t<div class=\"elementor-element elementor-element-935a7ba elementor-widget elementor-widget-text-editor\" data-id=\"935a7ba\" data-element_type=\"widget\" data-widget_type=\"text-editor.default\">\n\t\t\t\t<div class=\"elementor-widget-container\">\n\t\t\t\t\t\t\t\t\t<p class=\"paragraph\"><strong>Webov\u00e9 zhrnutie<\/strong><\/p><p class=\"paragraph\">Spolo\u010dnos\u0165 Shimadzu pr\u00e1ve uviedla na eur\u00f3psky trh ultrazvukov\u00fd optick\u00fd detektor ch\u00fdb MIV-X. Na rozdiel od be\u017en\u00fdch ultrazvukov\u00fdch syst\u00e9mov na detekciu ch\u00fdb detektor MIV-X zis\u0165uje a vizualizuje trhliny, dutiny, delamin\u00e1cie a in\u00e9 skryt\u00e9 chyby v oblastiach, kde je ultrazvukov\u00e9 testovanie n\u00e1ro\u010dn\u00e9 a ktor\u00e9 sa be\u017ene nedaj\u00fa vizu\u00e1lne skontrolova\u0165. Syst\u00e9m MIV-X tie\u017e poskytuje jasn\u00fa vizualiz\u00e1ciu v\u0161etk\u00fdch zisten\u00fdch ch\u00fdb. Pomocou pr\u00edstroja MIV-X m\u00f4\u017ee ka\u017ed\u00fd r\u00fdchlo a jednoducho vykona\u0165 vizu\u00e1lnu kontrolu povrchu a bl\u00edzkosti povrchu. V\u010faka t\u00fdmto a \u010fal\u0161\u00edm v\u00fdhod\u00e1m je MIV-X nov\u00fdm referen\u010dn\u00fdm zariaden\u00edm na r\u00fdchle, presn\u00e9 a jednoduch\u00e9 zis\u0165ovanie ch\u00fdb na povrchu a pod n\u00edm.<\/p>\t\t\t\t\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t\t\t<div class=\"elementor-element elementor-element-f962784 elementor-widget elementor-widget-text-editor\" data-id=\"f962784\" data-element_type=\"widget\" data-widget_type=\"text-editor.default\">\n\t\t\t\t<div class=\"elementor-widget-container\">\n\t\t\t\t\t\t\t\t\t<p>Internetov\u00e9 prepojenie: <br \/><a href=\"https:\/\/www.shimadzu.eu\/see-the-invisible\" target=\"_blank\" rel=\"noopener\">https:\/\/www.shimadzu.sk<\/a><\/p>\t\t\t\t\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t\t\t<\/div>","protected":false},"excerpt":{"rendered":"<p>Spolo\u010dnos\u0165 Shimadzu, svetov\u00fd l\u00edder v oblasti analytick\u00fdch pr\u00edstrojov a testovac\u00edch zariaden\u00ed, oznamuje eur\u00f3pske vydanie svojho nov\u00e9ho ultrazvukov\u00e9ho optick\u00e9ho detektora ch\u00fdb: MIV-X. Na rozdiel od be\u017en\u00fdch ultrazvukov\u00fdch syst\u00e9mov na detekciu ch\u00fdb MIV-X odha\u013euje chyby na povrchu aj pod n\u00edm. MIV-X tie\u017e poskytuje jasn\u00fa vizualiz\u00e1ciu v\u0161etk\u00fdch zisten\u00fdch ch\u00fdb - \u010fal\u0161ie zlep\u0161enie oproti konven\u010dn\u00fdm syst\u00e9mom.<\/p>","protected":false},"author":397,"featured_media":15289,"comment_status":"closed","ping_status":"closed","sticky":false,"template":"","format":"standard","meta":{"footnotes":""},"categories":[76],"tags":[],"class_list":["post-15293","post","type-post","status-publish","format-standard","has-post-thumbnail","hentry","category-press"],"yoast_head":"<!-- This site is optimized with the Yoast SEO plugin v25.4 - https:\/\/yoast.com\/wordpress\/plugins\/seo\/ -->\n<title>MAVIS MIV-X Ultrasonic Optical Flaw Detector | Shimadzu Press Release<\/title>\n<meta name=\"description\" content=\"Discover Shimadzu&#039;s MAVIS MIV-X, an ultrasonic optical flaw detector that visualizes surface and subsurface defects, enhancing non-destructive testing capabilities.\" \/>\n<meta name=\"robots\" content=\"index, follow, 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