{"id":15293,"date":"2024-09-17T10:04:27","date_gmt":"2024-09-17T08:04:27","guid":{"rendered":"https:\/\/dev.shimadzu-testing.com\/?p=15293"},"modified":"2025-02-05T10:46:55","modified_gmt":"2025-02-05T09:46:55","slug":"maivis-miv-x-ultrasonic-optical-flaw-detector-3","status":"publish","type":"post","link":"https:\/\/shimadzu-testing.com\/ro\/companie\/news-events-press\/press\/maivis-miv-x-ultrasonic-optical-flaw-detector-3\/","title":{"rendered":"MAIVIS MIV-X - Detector optic de defecte cu ultrasunete"},"content":{"rendered":"<div data-elementor-type=\"wp-post\" data-elementor-id=\"15293\" class=\"elementor elementor-15293\" data-elementor-post-type=\"post\">\n\t\t\t\t<div class=\"elementor-element elementor-element-f279f52 e-flex e-con-boxed e-con e-parent\" data-id=\"f279f52\" data-element_type=\"container\">\n\t\t\t\t\t<div class=\"e-con-inner\">\n\t\t\t\t<div class=\"elementor-element elementor-element-06aaf77 elementor-widget elementor-widget-text-editor\" data-id=\"06aaf77\" data-element_type=\"widget\" data-widget_type=\"text-editor.default\">\n\t\t\t\t<div class=\"elementor-widget-container\">\n\t\t\t\t\t\t\t\t\t<p class=\"heading-normal\"><strong>Mergi mai ad\u00e2nc\/v\u0103zi mai bine: o nou\u0103 tehnic\u0103 de inspec\u021bie dezv\u0103luie vizual defectele de sub suprafa\u021b\u0103<\/strong><\/p><ul class=\"list-with-hyphen\"><li>Detectarea optic\u0103 cu ultrasunete a defectelor este o metod\u0103 avansat\u0103 \u0219i nou\u0103 de analiz\u0103 a suprafe\u021belor de c\u0103tre Shimadzu.<\/li><li>MIV-X utilizeaz\u0103 aceast\u0103 tehnic\u0103 nedistructiv\u0103 pentru a detecta defectele de pe - \u0219i chiar sub - suprafa\u021b\u0103.<\/li><li>MIV-X nu numai c\u0103 detecteaz\u0103 fisuri, goluri, delaminare etc., ci le \u0219i afi\u0219eaz\u0103 vizual.<\/li><li>MIV-X ofer\u0103, de asemenea, u\u0219urin\u021b\u0103 de utilizare intuitiv\u0103, simplitate \u0219i vitez\u0103 pentru a spori performan\u021ba laboratorului.<\/li><\/ul><div>\u00a0<\/div><p class=\"paragraph\">Shimadzu, lider mondial \u00een instrumenta\u021bie analitic\u0103 \u0219i echipamente de testare, anun\u021b\u0103 lansarea \u00een Europa a noului s\u0103u detector optic de defecte cu ultrasunete: MIV-X. Spre deosebire de sistemele conven\u021bionale de detectare a defectelor cu ultrasunete, MIV-X expune defectele at\u00e2t pe suprafa\u021b\u0103, c\u00e2t \u0219i sub suprafa\u021b\u0103. MIV-X ofer\u0103, de asemenea, o vizualizare clar\u0103 a oric\u0103ror defecte detectate - o alt\u0103 \u00eembun\u0103t\u0103\u021bire fa\u021b\u0103 de sistemele conven\u021bionale.<\/p>\t\t\t\t\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t\t\t<div class=\"elementor-element elementor-element-a1eb732 elementor-widget elementor-widget-text-editor\" data-id=\"a1eb732\" data-element_type=\"widget\" data-widget_type=\"text-editor.default\">\n\t\t\t\t<div class=\"elementor-widget-container\">\n\t\t\t\t\t\t\t\t\t<p class=\"paragraph\"><strong>Avantaje distincte ale MIV-X<\/strong><\/p><ul class=\"list-with-hyphen\"><li><strong>\u00cembun\u0103t\u0103\u021be\u0219te inspec\u021bia at\u00e2t a zonelor de suprafa\u021b\u0103, c\u00e2t \u0219i a celor apropiate de suprafa\u021b\u0103<\/strong><br \/>Detectoarele conven\u021bionale de defecte cu ultrasunete ofer\u0103 rezultate bune \u00eencep\u00e2nd de la 1-5 mm, \u00een timp ce MIV-X deplaseaz\u0103 cu u\u0219urin\u021b\u0103 punctul de plecare al percep\u021biei precise la suprafa\u021b\u0103. Acest lucru \u00eel face ideal pentru analizarea exfolierii acoperirilor.<\/li><li><strong>l\u0103rge\u0219te zona de inspec\u021bie a loturilor<\/strong><br \/>Tehnicile conven\u021bionale inspecteaz\u0103 doar o zon\u0103 restr\u00e2ns\u0103, \u00een timp ce MIV-X utilizeaz\u0103 \u00eentregul c\u00e2mp vizual al camerei pentru a defini zona de inspec\u021bie. Acest lucru m\u0103re\u0219te c\u00e2mpul de observare p\u00e2n\u0103 la 400 x 600 mm \u0219i reduce timpul total de inspec\u021bie.<\/li><li><strong>Elimin\u0103 preocup\u0103rile legate de diferen\u021bele de impedan\u021b\u0103 acustic\u0103<\/strong><br \/>Instrumentele conven\u021bionale consider\u0103 dificil\u0103 inspectarea materialelor cu impedan\u021be acustice diferite. MIV-X dep\u0103\u0219e\u0219te cu succes provocarea impedan\u021bei \u0219i detecteaz\u0103 cu precizie defectele din e\u0219antioane multi-materiale<\/li><\/ul>\t\t\t\t\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t\t\t<div class=\"elementor-element elementor-element-20c9d37 elementor-widget elementor-widget-text-editor\" data-id=\"20c9d37\" data-element_type=\"widget\" data-widget_type=\"text-editor.default\">\n\t\t\t\t<div class=\"elementor-widget-container\">\n\t\t\t\t\t\t\t\t\t<p class=\"paragraph\"><strong>MIV = a face vizibil<\/strong><\/p><p class=\"paragraph\">MAIVIS-MIV-X utilizeaz\u0103 o tehnic\u0103 nou\u0103, brevetat\u0103 Shimadzu, de imagistic\u0103 prin lumin\u0103 pentru a vizualiza defectele ascunse. Prin combinarea unui oscilator ultrasonic cu un stroboscop, zona \u021bint\u0103 este supus\u0103 at\u00e2t undelor ultrasonice continue, c\u00e2t \u0219i iradierii imagistice cu lumin\u0103 laser. Prin observarea zonei de inspec\u021bie cu o camer\u0103 foto, orice deplasare microscopic\u0103 \u00een afara planului a suprafe\u021bei sau a suprafe\u021bei apropiate este detectat\u0103 cu u\u0219urin\u021b\u0103 \u0219i nedistructiv prin utilizarea shearografiei (interferometrie de forfecare cu model speckle). Din discontinuitatea rezultat\u0103 a undei ultrasonice, orice defecte pot fi vizualizate pe ecran.<\/p><p class=\"paragraph\">Aceast\u0103 detectare optic\u0103 a defectelor cu ultrasunete permite vizualizarea defectelor interne care sunt greu de detectat cu ajutorul testelor cu ultrasunete conven\u021bionale - p\u00e2n\u0103 la o ad\u00e2ncime de aproximativ 1 mm - inclusiv decojirea suprafe\u021belor de lipire \u0219i adezive ale materialelor eterogene, precum \u0219i a vopselelor, spray-urilor termice \u0219i a acoperirilor. De asemenea, detecteaz\u0103 cu u\u0219urin\u021b\u0103 defectele din \u00eembin\u0103ri \u0219i suprafe\u021bele de aderen\u021b\u0103 \u00een procesele de cercetare \u0219i dezvoltare care implic\u0103 materiale multiple, care sunt create prin combinarea diferitelor materiale pentru a cre\u0219te rezisten\u021ba \u0219i a reduce greutatea.<\/p>\t\t\t\t\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t\t\t<div class=\"elementor-element elementor-element-22f771e elementor-widget elementor-widget-text-editor\" data-id=\"22f771e\" data-element_type=\"widget\" data-widget_type=\"text-editor.default\">\n\t\t\t\t<div class=\"elementor-widget-container\">\n\t\t\t\t\t\t\t\t\t<p class=\"paragraph\"><strong>Aplica\u021bii performante pentru industrie \u0219i cercetare \u0219i dezvoltare<\/strong><\/p><p class=\"paragraph\">Datorit\u0103 domeniului s\u0103u de aplicare, profunzimii \u0219i vitezei de analiz\u0103 sporite, MIV-X ofer\u0103 numeroase beneficii pentru aplica\u021biile industriale \u0219i de cercetare \u00een domenii precum materiale, produse chimice, electricitate, electronic\u0103, semiconductori, transporturi \u0219i infrastructur\u0103. Acestea includ:<\/p><ul class=\"list-with-hyphen\"><li><em>Inspec\u021bia \u00eembin\u0103rilor \u00een materiale diferite<\/em><\/li><li><em>Inspec\u021bia fisurilor \u00eentr-un material de baz\u0103 sub o pelicul\u0103<\/em><\/li><li><em>Inspec\u021bia delamin\u0103rii suprafe\u021bei adezive \u00eentre CFRP \u0219i o\u021bel inoxidabil<\/em><\/li><li><em>Inspec\u021bia delamin\u0103rii suprafe\u021bei adezive \u00eentre CFRP \u0219i aliajul de titan<\/em><\/li><\/ul><p class=\"paragraph\">detecteaz\u0103 defecte \u00een \u00eembin\u0103ri \u0219i suprafe\u021be de lipire \u00een procesele de cercetare \u0219i dezvoltare care implic\u0103 materiale multiple, care sunt create prin combinarea diferitelor materiale pentru a cre\u0219te rezisten\u021ba \u0219i a reduce greutatea.<\/p>\t\t\t\t\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t\t\t<div class=\"elementor-element elementor-element-54f2cce elementor-widget elementor-widget-text-editor\" data-id=\"54f2cce\" data-element_type=\"widget\" data-widget_type=\"text-editor.default\">\n\t\t\t\t<div class=\"elementor-widget-container\">\n\t\t\t\t\t\t\t\t\t<p class=\"paragraph\"><strong>Caracteristici suplimentare de mare valoare<\/strong><\/p><ul class=\"list-with-hyphen\"><li>The <strong>Eliminarea zgomotului<\/strong> simplific\u0103 identificarea defectelor \u0219i ofer\u0103 o imagine clar\u0103, de \u00eenalt\u0103 defini\u021bie a defectelor.<\/li><li>The <strong>Afi\u0219area \u0219i marcarea dimensiunilor<\/strong> func\u021biile simplific\u0103 identificarea pozi\u021biei \u0219i dimensiunii defectului, iar interfa\u021ba simpl\u0103 cu utilizatorul \u0219i asisten\u021bii inteligen\u021bi, cum ar fi o scar\u0103 de afi\u0219are (rigl\u0103), permit prezentarea u\u0219oar\u0103 \u0219i explicit\u0103 a rezultatelor<\/li><li>Op\u021bional <strong>Set zoom optic<\/strong> asigur\u0103 vizualizarea unor defecte \u0219i mai mici prin sc\u0103derea dimensiunii minime de detec\u021bie cu un factor de aproximativ dou\u0103 (standardul MIV-X: de la aproximativ 1 mm diametru la 0,5 mm diametru). De asemenea, permite ajustarea axei laser-optic\u0103, \u00eembun\u0103t\u0103\u021bind uniformitatea iradierii.<\/li><\/ul>\t\t\t\t\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t\t\t<div class=\"elementor-element elementor-element-8411335 elementor-widget elementor-widget-text-editor\" data-id=\"8411335\" data-element_type=\"widget\" data-widget_type=\"text-editor.default\">\n\t\t\t\t<div class=\"elementor-widget-container\">\n\t\t\t\t\t\t\t\t\t<p class=\"paragraph\"><strong>Avansarea dincolo de solu\u021biile conven\u021bionale<\/strong><\/p><p class=\"paragraph\">Detectorul optic de defecte cu ultrasunete Shimadzu MIV-X detecteaz\u0103 \u0219i vizualizeaz\u0103 fisuri, goluri, delaminare \u0219i alte defecte ascunse \u00een zone \u00een care testarea cu ultrasunete este dificil\u0103 \u0219i care sunt \u00een mod normal imposibil de verificat vizual. Cu MIV-X, oricine poate efectua rapid \u0219i u\u0219or o inspec\u021bie vizual\u0103 a suprafe\u021belor \u0219i a suprafe\u021belor apropiate. Acestea \u0219i alte caracteristici avantajoase ale sale fac din MIV-X noul dispozitiv de referin\u021b\u0103 pentru detectarea rapid\u0103, precis\u0103 \u0219i u\u0219oar\u0103 a defectelor la suprafa\u021b\u0103 \u0219i sub aceasta. Este o alt\u0103 inova\u021bie util\u0103 de la Shimadzu.<\/p><p>\u00a0<\/p>\t\t\t\t\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t\t\t<div class=\"elementor-element elementor-element-935a7ba elementor-widget elementor-widget-text-editor\" data-id=\"935a7ba\" data-element_type=\"widget\" data-widget_type=\"text-editor.default\">\n\t\t\t\t<div class=\"elementor-widget-container\">\n\t\t\t\t\t\t\t\t\t<p class=\"paragraph\"><strong>Rezumat web<\/strong><\/p><p class=\"paragraph\">Shimadzu tocmai a lansat \u00een Europa detectorul optic de defecte cu ultrasunete MIV-X. Spre deosebire de sistemele conven\u021bionale de detectare a defectelor cu ultrasunete, MIV-X detecteaz\u0103 \u0219i vizualizeaz\u0103 fisuri, goluri, delaminare \u0219i alte defecte ascunse \u00een zone \u00een care testarea cu ultrasunete este dificil\u0103 \u0219i care sunt \u00een mod normal imposibil de verificat vizual. MIV-X ofer\u0103, de asemenea, o vizualizare clar\u0103 a oric\u0103ror defecte detectate. Cu MIV-X, oricine poate efectua rapid \u0219i u\u0219or o inspec\u021bie vizual\u0103 a suprafe\u021belor \u0219i a suprafe\u021belor apropiate. Acestea \u0219i celelalte avantaje ale sale fac din MIV-X noul dispozitiv de referin\u021b\u0103 pentru detectarea rapid\u0103, precis\u0103 \u0219i u\u0219oar\u0103 a defectelor la suprafa\u021b\u0103 \u0219i sub aceasta.<\/p>\t\t\t\t\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t\t\t<div class=\"elementor-element elementor-element-f962784 elementor-widget elementor-widget-text-editor\" data-id=\"f962784\" data-element_type=\"widget\" data-widget_type=\"text-editor.default\">\n\t\t\t\t<div class=\"elementor-widget-container\">\n\t\t\t\t\t\t\t\t\t<p>Link web: <br \/><a href=\"https:\/\/www.shimadzu.eu\/see-the-invisible\" target=\"_blank\" rel=\"noopener\">https:\/\/www.shimadzu.ro<\/a><\/p>\t\t\t\t\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t\t\t<\/div>","protected":false},"excerpt":{"rendered":"<p>Shimadzu, lider mondial \u00een instrumenta\u021bie analitic\u0103 \u0219i echipamente de testare, anun\u021b\u0103 lansarea \u00een Europa a noului s\u0103u detector optic de defecte cu ultrasunete: MIV-X. Spre deosebire de sistemele conven\u021bionale de detectare a defectelor cu ultrasunete, MIV-X expune defectele at\u00e2t pe suprafa\u021b\u0103, c\u00e2t \u0219i sub suprafa\u021b\u0103. MIV-X ofer\u0103, de asemenea, o vizualizare clar\u0103 a oric\u0103ror defecte detectate - o alt\u0103 \u00eembun\u0103t\u0103\u021bire fa\u021b\u0103 de sistemele conven\u021bionale.<\/p>","protected":false},"author":397,"featured_media":15289,"comment_status":"closed","ping_status":"closed","sticky":false,"template":"","format":"standard","meta":{"footnotes":""},"categories":[76],"tags":[],"class_list":["post-15293","post","type-post","status-publish","format-standard","has-post-thumbnail","hentry","category-press"],"yoast_head":"<!-- This site is optimized with the Yoast SEO plugin v25.4 - https:\/\/yoast.com\/wordpress\/plugins\/seo\/ -->\n<title>MAVIS MIV-X Ultrasonic Optical Flaw Detector | Shimadzu Press Release<\/title>\n<meta name=\"description\" content=\"Discover Shimadzu&#039;s MAVIS MIV-X, an ultrasonic optical flaw detector that visualizes surface and subsurface defects, enhancing non-destructive testing capabilities.\" \/>\n<meta name=\"robots\" content=\"index, follow, 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Ultrasonic Optical Flaw Detector | Shimadzu Press Release\",\"isPartOf\":{\"@id\":\"https:\/\/shimadzu-testing.com\/en\/#website\"},\"primaryImageOfPage\":{\"@id\":\"https:\/\/shimadzu-testing.com\/company\/news-events-press\/press\/maivis-miv-x-ultrasonic-optical-flaw-detector-3\/#primaryimage\"},\"image\":{\"@id\":\"https:\/\/shimadzu-testing.com\/company\/news-events-press\/press\/maivis-miv-x-ultrasonic-optical-flaw-detector-3\/#primaryimage\"},\"thumbnailUrl\":\"https:\/\/shimadzu-testing.com\/wp-content\/uploads\/2024\/09\/maivis-miv-x-ultrasonic-flaw-detector.jpg\",\"datePublished\":\"2024-09-17T08:04:27+00:00\",\"dateModified\":\"2025-02-05T09:46:55+00:00\",\"description\":\"Discover Shimadzu's MAVIS MIV-X, an ultrasonic optical flaw detector that visualizes surface and subsurface defects, enhancing non-destructive testing capabilities.\",\"breadcrumb\":{\"@id\":\"https:\/\/shimadzu-testing.com\/company\/news-events-press\/press\/maivis-miv-x-ultrasonic-optical-flaw-detector-3\/#breadcrumb\"},\"inLanguage\":\"ro-RO\",\"potentialAction\":[{\"@type\":\"ReadAction\",\"target\":[\"https:\/\/shimadzu-testing.com\/company\/news-events-press\/press\/maivis-miv-x-ultrasonic-optical-flaw-detector-3\/\"]}]},{\"@type\":\"ImageObject\",\"inLanguage\":\"ro-RO\",\"@id\":\"https:\/\/shimadzu-testing.com\/company\/news-events-press\/press\/maivis-miv-x-ultrasonic-optical-flaw-detector-3\/#primaryimage\",\"url\":\"https:\/\/shimadzu-testing.com\/wp-content\/uploads\/2024\/09\/maivis-miv-x-ultrasonic-flaw-detector.jpg\",\"contentUrl\":\"https:\/\/shimadzu-testing.com\/wp-content\/uploads\/2024\/09\/maivis-miv-x-ultrasonic-flaw-detector.jpg\",\"width\":1300,\"height\":680,\"caption\":\"Maivis MIV X ultrasonic flaw detector\"},{\"@type\":\"BreadcrumbList\",\"@id\":\"https:\/\/shimadzu-testing.com\/company\/news-events-press\/press\/maivis-miv-x-ultrasonic-optical-flaw-detector-3\/#breadcrumb\",\"itemListElement\":[{\"@type\":\"ListItem\",\"position\":1,\"name\":\"Startseite\",\"item\":\"https:\/\/shimadzu-testing.com\/\"},{\"@type\":\"ListItem\",\"position\":2,\"name\":\"MAIVIS MIV-X \u2013 Ultrasonic Optical Flaw Detector\"}]},{\"@type\":\"WebSite\",\"@id\":\"https:\/\/shimadzu-testing.com\/en\/#website\",\"url\":\"https:\/\/shimadzu-testing.com\/en\/\",\"name\":\"Shimadzu Testing\",\"description\":\"Shimadzu Testing\",\"publisher\":{\"@id\":\"https:\/\/shimadzu-testing.com\/en\/#organization\"},\"potentialAction\":[{\"@type\":\"SearchAction\",\"target\":{\"@type\":\"EntryPoint\",\"urlTemplate\":\"https:\/\/shimadzu-testing.com\/en\/?s={search_term_string}\"},\"query-input\":{\"@type\":\"PropertyValueSpecification\",\"valueRequired\":true,\"valueName\":\"search_term_string\"}}],\"inLanguage\":\"ro-RO\"},{\"@type\":\"Organization\",\"@id\":\"https:\/\/shimadzu-testing.com\/en\/#organization\",\"name\":\"Shimadzu Testing\",\"url\":\"https:\/\/shimadzu-testing.com\/en\/\",\"logo\":{\"@type\":\"ImageObject\",\"inLanguage\":\"ro-RO\",\"@id\":\"https:\/\/shimadzu-testing.com\/en\/#\/schema\/logo\/image\/\",\"url\":\"https:\/\/shimadzu-testing.com\/wp-content\/uploads\/2024\/08\/shimadzu-logo-roter-hintergrund.svg\",\"contentUrl\":\"https:\/\/shimadzu-testing.com\/wp-content\/uploads\/2024\/08\/shimadzu-logo-roter-hintergrund.svg\",\"width\":364,\"height\":100,\"caption\":\"Shimadzu Testing\"},\"image\":{\"@id\":\"https:\/\/shimadzu-testing.com\/en\/#\/schema\/logo\/image\/\"}},{\"@type\":\"Person\",\"@id\":\"https:\/\/shimadzu-testing.com\/en\/#\/schema\/person\/82be23aeb34a19e6a07902d79871061a\",\"name\":\"Stefanie Neureiter\",\"image\":{\"@type\":\"ImageObject\",\"inLanguage\":\"ro-RO\",\"@id\":\"https:\/\/shimadzu-testing.com\/en\/#\/schema\/person\/image\/\",\"url\":\"https:\/\/secure.gravatar.com\/avatar\/83552f0813ce85d276720e69f2491927c59a371cb7bf82caca1f7019efa165c1?s=96&d=mm&r=g\",\"contentUrl\":\"https:\/\/secure.gravatar.com\/avatar\/83552f0813ce85d276720e69f2491927c59a371cb7bf82caca1f7019efa165c1?s=96&d=mm&r=g\",\"caption\":\"Stefanie Neureiter\"}}]}<\/script>\n<!-- \/ Yoast SEO plugin. -->","yoast_head_json":{"title":"MAVIS MIV-X Ultrasonic Optical Flaw Detector | Shimadzu Press Release","description":"Discover Shimadzu's MAVIS MIV-X, an ultrasonic optical flaw detector that visualizes surface and subsurface defects, enhancing non-destructive testing capabilities.","robots":{"index":"index","follow":"follow","max-snippet":"max-snippet:-1","max-image-preview":"max-image-preview:large","max-video-preview":"max-video-preview:-1"},"canonical":"https:\/\/shimadzu-testing.com\/ro\/companie\/news-events-press\/press\/maivis-miv-x-ultrasonic-optical-flaw-detector-3\/","twitter_card":"summary_large_image","twitter_title":"MAVIS MIV-X Ultrasonic Optical Flaw Detector | Shimadzu Press Release","twitter_description":"Discover Shimadzu's MAVIS MIV-X, an ultrasonic optical flaw detector that visualizes surface and subsurface defects, enhancing non-destructive testing capabilities.","twitter_image":"https:\/\/shimadzu-testing.com\/wp-content\/uploads\/2024\/09\/maivis-miv-x-ultrasonic-flaw-detector.jpg","twitter_misc":{"Scris de":"Stefanie Neureiter","Timp estimat pentru citire":"4 minute"},"schema":{"@context":"https:\/\/schema.org","@graph":[{"@type":"Article","@id":"https:\/\/shimadzu-testing.com\/company\/news-events-press\/press\/maivis-miv-x-ultrasonic-optical-flaw-detector-3\/#article","isPartOf":{"@id":"https:\/\/shimadzu-testing.com\/company\/news-events-press\/press\/maivis-miv-x-ultrasonic-optical-flaw-detector-3\/"},"author":{"name":"Stefanie Neureiter","@id":"https:\/\/shimadzu-testing.com\/en\/#\/schema\/person\/82be23aeb34a19e6a07902d79871061a"},"headline":"MAIVIS MIV-X \u2013 Ultrasonic Optical Flaw Detector","datePublished":"2024-09-17T08:04:27+00:00","dateModified":"2025-02-05T09:46:55+00:00","mainEntityOfPage":{"@id":"https:\/\/shimadzu-testing.com\/company\/news-events-press\/press\/maivis-miv-x-ultrasonic-optical-flaw-detector-3\/"},"wordCount":793,"publisher":{"@id":"https:\/\/shimadzu-testing.com\/en\/#organization"},"image":{"@id":"https:\/\/shimadzu-testing.com\/company\/news-events-press\/press\/maivis-miv-x-ultrasonic-optical-flaw-detector-3\/#primaryimage"},"thumbnailUrl":"https:\/\/shimadzu-testing.com\/wp-content\/uploads\/2024\/09\/maivis-miv-x-ultrasonic-flaw-detector.jpg","articleSection":["Press"],"inLanguage":"ro-RO"},{"@type":"WebPage","@id":"https:\/\/shimadzu-testing.com\/company\/news-events-press\/press\/maivis-miv-x-ultrasonic-optical-flaw-detector-3\/","url":"https:\/\/shimadzu-testing.com\/company\/news-events-press\/press\/maivis-miv-x-ultrasonic-optical-flaw-detector-3\/","name":"MAVIS MIV-X Ultrasonic Optical Flaw Detector | Shimadzu Press Release","isPartOf":{"@id":"https:\/\/shimadzu-testing.com\/en\/#website"},"primaryImageOfPage":{"@id":"https:\/\/shimadzu-testing.com\/company\/news-events-press\/press\/maivis-miv-x-ultrasonic-optical-flaw-detector-3\/#primaryimage"},"image":{"@id":"https:\/\/shimadzu-testing.com\/company\/news-events-press\/press\/maivis-miv-x-ultrasonic-optical-flaw-detector-3\/#primaryimage"},"thumbnailUrl":"https:\/\/shimadzu-testing.com\/wp-content\/uploads\/2024\/09\/maivis-miv-x-ultrasonic-flaw-detector.jpg","datePublished":"2024-09-17T08:04:27+00:00","dateModified":"2025-02-05T09:46:55+00:00","description":"Discover Shimadzu's MAVIS MIV-X, an ultrasonic optical flaw detector that visualizes surface and subsurface defects, enhancing non-destructive testing capabilities.","breadcrumb":{"@id":"https:\/\/shimadzu-testing.com\/company\/news-events-press\/press\/maivis-miv-x-ultrasonic-optical-flaw-detector-3\/#breadcrumb"},"inLanguage":"ro-RO","potentialAction":[{"@type":"ReadAction","target":["https:\/\/shimadzu-testing.com\/company\/news-events-press\/press\/maivis-miv-x-ultrasonic-optical-flaw-detector-3\/"]}]},{"@type":"ImageObject","inLanguage":"ro-RO","@id":"https:\/\/shimadzu-testing.com\/company\/news-events-press\/press\/maivis-miv-x-ultrasonic-optical-flaw-detector-3\/#primaryimage","url":"https:\/\/shimadzu-testing.com\/wp-content\/uploads\/2024\/09\/maivis-miv-x-ultrasonic-flaw-detector.jpg","contentUrl":"https:\/\/shimadzu-testing.com\/wp-content\/uploads\/2024\/09\/maivis-miv-x-ultrasonic-flaw-detector.jpg","width":1300,"height":680,"caption":"Maivis MIV X ultrasonic flaw detector"},{"@type":"BreadcrumbList","@id":"https:\/\/shimadzu-testing.com\/company\/news-events-press\/press\/maivis-miv-x-ultrasonic-optical-flaw-detector-3\/#breadcrumb","itemListElement":[{"@type":"ListItem","position":1,"name":"Startseite","item":"https:\/\/shimadzu-testing.com\/"},{"@type":"ListItem","position":2,"name":"MAIVIS MIV-X \u2013 Ultrasonic Optical Flaw Detector"}]},{"@type":"WebSite","@id":"https:\/\/shimadzu-testing.com\/en\/#website","url":"https:\/\/shimadzu-testing.com\/en\/","name":"Shimadzu Testing","description":"Shimadzu Testing","publisher":{"@id":"https:\/\/shimadzu-testing.com\/en\/#organization"},"potentialAction":[{"@type":"SearchAction","target":{"@type":"EntryPoint","urlTemplate":"https:\/\/shimadzu-testing.com\/en\/?s={search_term_string}"},"query-input":{"@type":"PropertyValueSpecification","valueRequired":true,"valueName":"search_term_string"}}],"inLanguage":"ro-RO"},{"@type":"Organization","@id":"https:\/\/shimadzu-testing.com\/en\/#organization","name":"Shimadzu Testing","url":"https:\/\/shimadzu-testing.com\/en\/","logo":{"@type":"ImageObject","inLanguage":"ro-RO","@id":"https:\/\/shimadzu-testing.com\/en\/#\/schema\/logo\/image\/","url":"https:\/\/shimadzu-testing.com\/wp-content\/uploads\/2024\/08\/shimadzu-logo-roter-hintergrund.svg","contentUrl":"https:\/\/shimadzu-testing.com\/wp-content\/uploads\/2024\/08\/shimadzu-logo-roter-hintergrund.svg","width":364,"height":100,"caption":"Shimadzu Testing"},"image":{"@id":"https:\/\/shimadzu-testing.com\/en\/#\/schema\/logo\/image\/"}},{"@type":"Person","@id":"https:\/\/shimadzu-testing.com\/en\/#\/schema\/person\/82be23aeb34a19e6a07902d79871061a","name":"Stefanie Neureiter","image":{"@type":"ImageObject","inLanguage":"ro-RO","@id":"https:\/\/shimadzu-testing.com\/en\/#\/schema\/person\/image\/","url":"https:\/\/secure.gravatar.com\/avatar\/83552f0813ce85d276720e69f2491927c59a371cb7bf82caca1f7019efa165c1?s=96&d=mm&r=g","contentUrl":"https:\/\/secure.gravatar.com\/avatar\/83552f0813ce85d276720e69f2491927c59a371cb7bf82caca1f7019efa165c1?s=96&d=mm&r=g","caption":"Stefanie Neureiter"}}]}},"_links":{"self":[{"href":"https:\/\/shimadzu-testing.com\/ro\/wp-json\/wp\/v2\/posts\/15293","targetHints":{"allow":["GET"]}}],"collection":[{"href":"https:\/\/shimadzu-testing.com\/ro\/wp-json\/wp\/v2\/posts"}],"about":[{"href":"https:\/\/shimadzu-testing.com\/ro\/wp-json\/wp\/v2\/types\/post"}],"author":[{"embeddable":true,"href":"https:\/\/shimadzu-testing.com\/ro\/wp-json\/wp\/v2\/users\/397"}],"replies":[{"embeddable":true,"href":"https:\/\/shimadzu-testing.com\/ro\/wp-json\/wp\/v2\/comments?post=15293"}],"version-history":[{"count":0,"href":"https:\/\/shimadzu-testing.com\/ro\/wp-json\/wp\/v2\/posts\/15293\/revisions"}],"wp:featuredmedia":[{"embeddable":true,"href":"https:\/\/shimadzu-testing.com\/ro\/wp-json\/wp\/v2\/media\/15289"}],"wp:attachment":[{"href":"https:\/\/shimadzu-testing.com\/ro\/wp-json\/wp\/v2\/media?parent=15293"}],"wp:term":[{"taxonomy":"category","embeddable":true,"href":"https:\/\/shimadzu-testing.com\/ro\/wp-json\/wp\/v2\/categories?post=15293"},{"taxonomy":"post_tag","embeddable":true,"href":"https:\/\/shimadzu-testing.com\/ro\/wp-json\/wp\/v2\/tags?post=15293"}],"curies":[{"name":"wp","href":"https:\/\/api.w.org\/{rel}","templated":true}]}}