{"id":15293,"date":"2024-09-17T10:04:27","date_gmt":"2024-09-17T08:04:27","guid":{"rendered":"https:\/\/dev.shimadzu-testing.com\/?p=15293"},"modified":"2025-02-05T10:46:55","modified_gmt":"2025-02-05T09:46:55","slug":"maivis-miv-x-ultrasonic-optical-flaw-detector-3","status":"publish","type":"post","link":"https:\/\/shimadzu-testing.com\/cz\/spolecnost\/news-events-press\/press\/maivis-miv-x-ultrasonic-optical-flaw-detector-3\/","title":{"rendered":"MAIVIS MIV-X - Ultrazvukov\u00fd optick\u00fd detektor vad"},"content":{"rendered":"<div data-elementor-type=\"wp-post\" data-elementor-id=\"15293\" class=\"elementor elementor-15293\" data-elementor-post-type=\"post\">\n\t\t\t\t<div class=\"elementor-element elementor-element-f279f52 e-flex e-con-boxed e-con e-parent\" data-id=\"f279f52\" data-element_type=\"container\">\n\t\t\t\t\t<div class=\"e-con-inner\">\n\t\t\t\t<div class=\"elementor-element elementor-element-06aaf77 elementor-widget elementor-widget-text-editor\" data-id=\"06aaf77\" data-element_type=\"widget\" data-widget_type=\"text-editor.default\">\n\t\t\t\t<div class=\"elementor-widget-container\">\n\t\t\t\t\t\t\t\t\t<p class=\"heading-normal\"><strong>Jd\u011bte hloub\u011bji\/vid\u00edte l\u00e9pe: nov\u00e1 kontroln\u00ed technika vizu\u00e1ln\u011b odhal\u00ed vady pod povrchem<\/strong><\/p><ul class=\"list-with-hyphen\"><li>Ultrazvukov\u00e1 optick\u00e1 detekce vad je pokro\u010dil\u00e1, nov\u00e1 metoda anal\u00fdzy povrchu od spole\u010dnosti Shimadzu.<\/li><li>MIV-X vyu\u017e\u00edv\u00e1 tuto nedestruktivn\u00ed techniku k odhalov\u00e1n\u00ed vad na povrchu - a dokonce i pod n\u00edm.<\/li><li>MIV-X nejen detekuje praskliny, dutiny, delaminace atd., ale tak\u00e9 je vizu\u00e1ln\u011b zobrazuje.<\/li><li>MIV-X tak\u00e9 nab\u00edz\u00ed intuitivn\u00ed snadn\u00e9 pou\u017e\u00edv\u00e1n\u00ed, jednoduchost a rychlost, kter\u00e9 zvy\u0161uj\u00ed v\u00fdkonnost laborato\u0159e.<\/li><\/ul><div>\u00a0<\/div><p class=\"paragraph\">Spole\u010dnost Shimadzu, sv\u011btov\u00fd l\u00eddr v oblasti analytick\u00fdch p\u0159\u00edstroj\u016f a zku\u0161ebn\u00edch za\u0159\u00edzen\u00ed, oznamuje uveden\u00ed nov\u00e9ho ultrazvukov\u00e9ho optick\u00e9ho detektoru vad na evropsk\u00fd trh: MIV-X. Na rozd\u00edl od b\u011b\u017en\u00fdch ultrazvukov\u00fdch syst\u00e9m\u016f pro detekci vad odhaluje MIV-X vady na povrchu i pod n\u00edm. MIV-X tak\u00e9 poskytuje jasnou vizualizaci v\u0161ech zji\u0161t\u011bn\u00fdch vad - dal\u0161\u00ed vylep\u0161en\u00ed oproti konven\u010dn\u00edm syst\u00e9m\u016fm.<\/p>\t\t\t\t\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t\t\t<div class=\"elementor-element elementor-element-a1eb732 elementor-widget elementor-widget-text-editor\" data-id=\"a1eb732\" data-element_type=\"widget\" data-widget_type=\"text-editor.default\">\n\t\t\t\t<div class=\"elementor-widget-container\">\n\t\t\t\t\t\t\t\t\t<p class=\"paragraph\"><strong>V\u00fdrazn\u00e9 v\u00fdhody MIV-X<\/strong><\/p><ul class=\"list-with-hyphen\"><li><strong>Zlep\u0161uje kontrolu povrchov\u00fdch i p\u0159\u00edpovrchov\u00fdch oblast\u00ed.<\/strong><br \/>B\u011b\u017en\u00e9 ultrazvukov\u00e9 detektory vad poskytuj\u00ed dobr\u00e9 v\u00fdsledky od 1-5 mm, zat\u00edmco MIV-X snadno posouv\u00e1 po\u010d\u00e1te\u010dn\u00ed bod p\u0159esn\u00e9ho vn\u00edm\u00e1n\u00ed na povrch. D\u00edky tomu je ide\u00e1ln\u00ed pro anal\u00fdzu odlupov\u00e1n\u00ed n\u00e1t\u011br\u016f.<\/li><li><strong>Zv\u011bt\u0161uje oblast kontroly \u0161ar\u017e\u00ed<\/strong><br \/>B\u011b\u017en\u00e9 techniky kontroluj\u00ed pouze omezenou oblast, zat\u00edmco kamera MIV-X vyu\u017e\u00edv\u00e1 k vymezen\u00ed oblasti kontroly cel\u00e9 zorn\u00e9 pole kamery. T\u00edm se zv\u011bt\u0161uje pozorovac\u00ed pole a\u017e na 400 x 600 mm a zkracuje se celkov\u00e1 doba kontroly.<\/li><li><strong>Odstra\u0148uje obavy z rozd\u00edl\u016f v akustick\u00e9 impedanci.<\/strong><br \/>Kontrola materi\u00e1l\u016f s r\u016fznou akustickou impedanc\u00ed je pro b\u011b\u017en\u00e9 n\u00e1stroje n\u00e1ro\u010dn\u00e1. P\u0159\u00edstroj MIV-X \u00fasp\u011b\u0161n\u011b p\u0159ekon\u00e1v\u00e1 probl\u00e9m impedance a p\u0159esn\u011b detekuje vady ve vzorc\u00edch z r\u016fzn\u00fdch materi\u00e1l\u016f.<\/li><\/ul>\t\t\t\t\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t\t\t<div class=\"elementor-element elementor-element-20c9d37 elementor-widget elementor-widget-text-editor\" data-id=\"20c9d37\" data-element_type=\"widget\" data-widget_type=\"text-editor.default\">\n\t\t\t\t<div class=\"elementor-widget-container\">\n\t\t\t\t\t\t\t\t\t<p class=\"paragraph\"><strong>MIV = zviditelnit<\/strong><\/p><p class=\"paragraph\">MAIVIS-MIV-X vyu\u017e\u00edv\u00e1 novou patentovanou sv\u011btelnou zobrazovac\u00ed techniku spole\u010dnosti Shimadzu k vizualizaci skryt\u00fdch vad. Kombinac\u00ed ultrazvukov\u00e9ho oscil\u00e1toru a stroboskopu je c\u00edlov\u00e1 oblast vystavena jak nep\u0159etr\u017eit\u00e9mu ultrazvukov\u00e9mu vln\u011bn\u00ed, tak laserov\u00e9mu sv\u011bteln\u00e9mu zobrazov\u00e1n\u00ed. Pozorov\u00e1n\u00edm kontrolovan\u00e9 oblasti kamerou se pomoc\u00ed shearografie (interferometrie se st\u0159i\u017en\u00fdm vzorkem) snadno a nedestruktivn\u011b zjist\u00ed jak\u00fdkoli mikroskopick\u00fd posun povrchu nebo povrchu v jeho bl\u00edzkosti. Z v\u00fdsledn\u00e9 nespojitosti ultrazvukov\u00e9 vlny lze na displeji zobrazit p\u0159\u00edpadn\u00e9 vady.<\/p><p class=\"paragraph\">Tato ultrazvukov\u00e1 optick\u00e1 detekce defekt\u016f umo\u017e\u0148uje vizualizaci vnit\u0159n\u00edch defekt\u016f, kter\u00e9 lze b\u011b\u017en\u00fdm ultrazvukov\u00fdm testov\u00e1n\u00edm obt\u00ed\u017en\u011b nal\u00e9zt - a\u017e do hloubky p\u0159ibli\u017en\u011b 1 mm - v\u010detn\u011b odlupov\u00e1n\u00ed spojovac\u00edch a adhezn\u00edch povrch\u016f heterogenn\u00edch materi\u00e1l\u016f, jako\u017e i n\u00e1t\u011br\u016f, tepeln\u00fdch n\u00e1st\u0159ik\u016f a povlak\u016f. A snadno odhal\u00ed vady spoj\u016f a lepen\u00fdch povrch\u016f ve v\u00fdzkumn\u00fdch a v\u00fdvojov\u00fdch procesech zahrnuj\u00edc\u00edch v\u00edcemateri\u00e1ly, kter\u00e9 vznikaj\u00ed kombinac\u00ed r\u016fzn\u00fdch materi\u00e1l\u016f za \u00fa\u010delem zv\u00fd\u0161en\u00ed pevnosti a sn\u00ed\u017een\u00ed hmotnosti.<\/p>\t\t\t\t\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t\t\t<div class=\"elementor-element elementor-element-22f771e elementor-widget elementor-widget-text-editor\" data-id=\"22f771e\" data-element_type=\"widget\" data-widget_type=\"text-editor.default\">\n\t\t\t\t<div class=\"elementor-widget-container\">\n\t\t\t\t\t\t\t\t\t<p class=\"paragraph\"><strong>V\u00fdkonn\u00e9 aplikace pro pr\u016fmysl a v\u00fdzkum a v\u00fdvoj<\/strong><\/p><p class=\"paragraph\">D\u00edky v\u011bt\u0161\u00edmu rozsahu, hloubce a rychlosti anal\u00fdzy nab\u00edz\u00ed MIV-X \u0159adu v\u00fdhod pro pr\u016fmyslov\u00e9 a v\u00fdzkumn\u00e9 aplikace v oblastech, jako jsou materi\u00e1ly, chemik\u00e1lie, elektrotechnika, elektronika, polovodi\u010de, doprava a infrastruktura. Pat\u0159\u00ed mezi n\u011b:<\/p><ul class=\"list-with-hyphen\"><li><em>Kontrola spoj\u016f u r\u016fznorod\u00fdch materi\u00e1l\u016f<\/em><\/li><li><em>Kontrola trhlin v z\u00e1kladn\u00edm materi\u00e1lu pod f\u00f3li\u00ed<\/em><\/li><li><em>Kontrola delaminace adhezivn\u00edho povrchu mezi CFRP a nerezovou ocel\u00ed<\/em><\/li><li><em>Kontrola delaminace adhezivn\u00edho povrchu mezi CFRP a titanovou slitinou<\/em><\/li><\/ul><p class=\"paragraph\">odhaluje vady spoj\u016f a spojovac\u00edch ploch ve v\u00fdzkumn\u00fdch a v\u00fdvojov\u00fdch procesech zahrnuj\u00edc\u00edch v\u00edcemateri\u00e1ly, kter\u00e9 vznikaj\u00ed kombinac\u00ed r\u016fzn\u00fdch materi\u00e1l\u016f za \u00fa\u010delem zv\u00fd\u0161en\u00ed pevnosti a sn\u00ed\u017een\u00ed hmotnosti.<\/p>\t\t\t\t\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t\t\t<div class=\"elementor-element elementor-element-54f2cce elementor-widget elementor-widget-text-editor\" data-id=\"54f2cce\" data-element_type=\"widget\" data-widget_type=\"text-editor.default\">\n\t\t\t\t<div class=\"elementor-widget-container\">\n\t\t\t\t\t\t\t\t\t<p class=\"paragraph\"><strong>Dal\u0161\u00ed hodnotn\u00e9 funkce<\/strong><\/p><ul class=\"list-with-hyphen\"><li>Na str\u00e1nk\u00e1ch <strong>Odstra\u0148ov\u00e1n\u00ed hluku<\/strong> Funkce zjednodu\u0161uje identifikaci vad a poskytuje jasn\u00fd obraz vad ve vysok\u00e9m rozli\u0161en\u00ed.<\/li><li>Na str\u00e1nk\u00e1ch <strong>Zobrazen\u00ed a zna\u010den\u00ed rozm\u011br\u016f<\/strong> funkce zjednodu\u0161uj\u00ed identifikaci polohy a velikosti defektu a jednoduch\u00e9 u\u017eivatelsk\u00e9 rozhran\u00ed a chytr\u00e9 pom\u016fcky, jako je m\u011b\u0159\u00edtko (prav\u00edtko), umo\u017e\u0148uj\u00ed snadnou a p\u0159ehlednou prezentaci v\u00fdsledk\u016f.<\/li><li>Voliteln\u00fd <strong>Sada optick\u00e9ho zoomu<\/strong> umo\u017e\u0148uje vizualizaci je\u0161t\u011b men\u0161\u00edch defekt\u016f d\u00edky sn\u00ed\u017een\u00ed minim\u00e1ln\u00ed detek\u010dn\u00ed velikosti p\u0159ibli\u017en\u011b dvojn\u00e1sobn\u011b (standard MIV-X: z pr\u016fm\u011bru p\u0159ibli\u017en\u011b 1 mm na 0,5 mm). Umo\u017e\u0148uje tak\u00e9 nastaven\u00ed osy laseru a optiky, co\u017e zlep\u0161uje rovnom\u011brnost oz\u00e1\u0159en\u00ed.<\/li><\/ul>\t\t\t\t\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t\t\t<div class=\"elementor-element elementor-element-8411335 elementor-widget elementor-widget-text-editor\" data-id=\"8411335\" data-element_type=\"widget\" data-widget_type=\"text-editor.default\">\n\t\t\t\t<div class=\"elementor-widget-container\">\n\t\t\t\t\t\t\t\t\t<p class=\"paragraph\"><strong>Pokrok nad r\u00e1mec b\u011b\u017en\u00fdch \u0159e\u0161en\u00ed<\/strong><\/p><p class=\"paragraph\">Ultrazvukov\u00fd optick\u00fd detektor vad MIV-X spole\u010dnosti Shimadzu detekuje a vizualizuje praskliny, dutiny, delaminace a dal\u0161\u00ed skryt\u00e9 vady v oblastech, kde je ultrazvukov\u00e9 testov\u00e1n\u00ed obt\u00ed\u017en\u00e9 a kter\u00e9 obvykle nelze vizu\u00e1ln\u011b zkontrolovat. S detektorem MIV-X m\u016f\u017ee ka\u017ed\u00fd snadno a rychle prov\u00e9st vizu\u00e1ln\u00ed kontrolu povrchu a bl\u00edzkosti povrchu. D\u00edky t\u011bmto a dal\u0161\u00edm v\u00fdhodn\u00fdm vlastnostem je p\u0159\u00edstroj MIV-X nov\u00fdm referen\u010dn\u00edm za\u0159\u00edzen\u00edm pro rychlou, p\u0159esnou a snadnou detekci vad na povrchu i pod n\u00edm. Je to dal\u0161\u00ed u\u017eite\u010dn\u00e1 inovace od spole\u010dnosti Shimadzu.<\/p><p>\u00a0<\/p>\t\t\t\t\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t\t\t<div class=\"elementor-element elementor-element-935a7ba elementor-widget elementor-widget-text-editor\" data-id=\"935a7ba\" data-element_type=\"widget\" data-widget_type=\"text-editor.default\">\n\t\t\t\t<div class=\"elementor-widget-container\">\n\t\t\t\t\t\t\t\t\t<p class=\"paragraph\"><strong>Webov\u00e9 shrnut\u00ed<\/strong><\/p><p class=\"paragraph\">Spole\u010dnost Shimadzu pr\u00e1v\u011b uvedla na evropsk\u00fd trh ultrazvukov\u00fd optick\u00fd detektor vad MIV-X. Na rozd\u00edl od b\u011b\u017en\u00fdch ultrazvukov\u00fdch syst\u00e9m\u016f pro detekci vad detekuje a vizualizuje praskliny, dutiny, delaminace a dal\u0161\u00ed skryt\u00e9 vady v oblastech, kde je ultrazvukov\u00e9 testov\u00e1n\u00ed obt\u00ed\u017en\u00e9 a kter\u00e9 obvykle nelze vizu\u00e1ln\u011b zkontrolovat. MIV-X rovn\u011b\u017e poskytuje jasnou vizualizaci v\u0161ech zji\u0161t\u011bn\u00fdch vad. S p\u0159\u00edstrojem MIV-X m\u016f\u017ee ka\u017ed\u00fd snadno a rychle prov\u00e9st vizu\u00e1ln\u00ed kontrolu povrchu a bl\u00edzkosti povrchu. D\u00edky t\u011bmto a dal\u0161\u00edm v\u00fdhod\u00e1m je MIV-X nov\u00fdm srovn\u00e1vac\u00edm za\u0159\u00edzen\u00edm pro rychlou, p\u0159esnou a snadnou detekci vad na povrchu i pod n\u00edm.<\/p>\t\t\t\t\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t\t\t<div class=\"elementor-element elementor-element-f962784 elementor-widget elementor-widget-text-editor\" data-id=\"f962784\" data-element_type=\"widget\" data-widget_type=\"text-editor.default\">\n\t\t\t\t<div class=\"elementor-widget-container\">\n\t\t\t\t\t\t\t\t\t<p>Odkaz na web: <br \/><a href=\"https:\/\/www.shimadzu.eu\/see-the-invisible\" target=\"_blank\" rel=\"noopener\">https:\/\/www.shimadzu.cz<\/a><\/p>\t\t\t\t\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t\t\t<\/div>","protected":false},"excerpt":{"rendered":"<p>Spole\u010dnost Shimadzu, sv\u011btov\u00fd l\u00eddr v oblasti analytick\u00fdch p\u0159\u00edstroj\u016f a zku\u0161ebn\u00edch za\u0159\u00edzen\u00ed, oznamuje uveden\u00ed nov\u00e9ho ultrazvukov\u00e9ho optick\u00e9ho detektoru vad na evropsk\u00fd trh: MIV-X. Na rozd\u00edl od b\u011b\u017en\u00fdch ultrazvukov\u00fdch syst\u00e9m\u016f pro detekci vad odhaluje MIV-X vady na povrchu i pod n\u00edm. MIV-X tak\u00e9 poskytuje jasnou vizualizaci v\u0161ech zji\u0161t\u011bn\u00fdch vad - dal\u0161\u00ed vylep\u0161en\u00ed oproti konven\u010dn\u00edm syst\u00e9m\u016fm.<\/p>","protected":false},"author":397,"featured_media":15289,"comment_status":"closed","ping_status":"closed","sticky":false,"template":"","format":"standard","meta":{"footnotes":""},"categories":[76],"tags":[],"class_list":["post-15293","post","type-post","status-publish","format-standard","has-post-thumbnail","hentry","category-press"],"yoast_head":"<!-- This site is optimized with the Yoast SEO plugin v25.4 - https:\/\/yoast.com\/wordpress\/plugins\/seo\/ -->\n<title>MAVIS MIV-X Ultrasonic Optical Flaw Detector | Shimadzu Press Release<\/title>\n<meta name=\"description\" content=\"Discover Shimadzu&#039;s MAVIS MIV-X, an ultrasonic optical flaw detector that visualizes surface and subsurface defects, enhancing non-destructive testing capabilities.\" \/>\n<meta name=\"robots\" content=\"index, follow, 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